Package-on-package structures

ABSTRACT

Embodiments of the present disclosure provide a package on package arrangement comprising a bottom package and a second package. The first package includes a substrate layer including (i) a top side and (ii) a bottom side that is opposite to the top side. Further, the top side defines a substantially flat surface. The first package also includes a die coupled to the bottom side of the substrate layer. The second package includes a plurality of rows of solder balls, and the second package is attached to the substantially flat surface of the substrate layer via the plurality of rows of solder balls.

CROSS REFERENCE TO RELATED APPLICATION

This disclosure claims priority to U.S. Provisional Patent ApplicationNo. 61/525,521, filed Aug. 19, 2011, the entire specification of whichis hereby incorporated by reference in its entirety for all purposes,except for those sections, if any, that are inconsistent with thisspecification.

TECHNICAL FIELD

Embodiments of the present disclosure relate to package on package (POP)structures, and more particularly to packaging arrangements thatincorporate a base package with a die-down flipped structure.

BACKGROUND

The background description provided herein is for the purpose ofgenerally presenting the context of the disclosure. Work of thepresently named inventors, to the extent it is described in thisbackground section, as well as aspects of the description that may nototherwise qualify as prior art at the time of filing, are neitherexpressly nor impliedly admitted as prior art against the presentdisclosure.

Typically, with many multi-chip packaging arrangements, a packagingarrangement is arranged in one of either a package-on-package (PoP)arrangement, or a multi-chip module (MCM) arrangement. These packagingarrangements tend to be fairly thick (e.g., approximately 1.7millimeters to 2.0 millimeters).

A PoP arrangement may include an integrated circuit that combines two ormore packages on top of each other. For instance, a PoP arrangement maybe configured with two or more memory device packages. A PoP arrangementmay also be configured with mixed logic-memory stacking that includeslogic in a bottom package and memory in a top package or vice versa.

Typically, a die of associated with a package located on the bottom of aPoP arrangement (referred to herein as a “bottom package”) limits thefootprint of a package located above the bottom package (referred toherein as a “top package”) to be a certain size. Additionally, such aconfiguration generally limits the top package to two rows of peripheralsolder balls. An example of such a packaging arrangement 800 isillustrated in FIG. 8 and includes a top package 802 and a bottompackage 804. As can be seen, the bottom package 804 includes a die 806attached to a substrate 808 via an adhesive 810. The die 806 is coupledto the substrate 808 via a wirebonding process with wires 812. Solderballs 814 are provided for coupling the packaging arrangement 800 toanother substrate (not illustrated) such as, for example, a printedcircuit board (PCB). The top package 802 includes a die 816 coupled to asubstrate 818. Solder balls 820 are provided to couple the top package802 to the bottom package 804. The top package 802 may include anenclosure 822, generally in the form of an encapsulant, if desired. Ascan be seen, only two rows of solder balls 820 can be provided due tothe presence of the die 806 and an enclosure 824 (generally in the formof an encapsulant and which may or may not be included) of the bottompackage 804. Thus, top packages may be required to have larger sizes orfootprints to avoid the die 806 of bottom packages when a top package isattached to the bottom package. Such packaging arrangements 800 can alsopresent problems with clearance issues for the top package 802 withrespect to the die 806 and/or enclosure 824.

FIG. 9 illustrates another example of a packaging arrangement 900 wherea bottom package 904 has been created with a Mold-Array-Process (MAP).The bottom package 904 is similar to the bottom package 804 of FIG. 8and includes an encapsulant 906. The encapsulant 906 is generally etchedto expose solder balls 908. Alternatively, the encapsulant 906 is etchedand then solder balls 908 are deposited within the openings 910. Such apackaging arrangement 900 once again only allows for the inclusion oftwo rows of solder balls 820 around the periphery of the top package 802due to the presence of the die 806 and the encapsulant 906. Suchpackaging arrangements 900 can also present problems with clearanceissues for the top package 802 with respect to the die 806 and theencapsulant 906, as well as alignment issues with respect to theopenings 910.

SUMMARY

In various embodiments, the present disclosure provides a package onpackage structure comprising a package on package arrangement comprisinga bottom package and a second package. The first package includes asubstrate layer including (i) a top side and (ii) a bottom side that isopposite to the top side. Further, the top side defines a substantiallyflat surface. The first package also includes a die coupled to thebottom side of the substrate layer. The second package includes aplurality of rows of solder balls, and the second package is attached tothe substantially flat surface of the substrate layer via the pluralityof rows of solder balls.

The present disclosure also provides a method comprising providing afirst package including a substrate layer. The substrate layer includes(i) a top side and (ii) a bottom side that is opposite to the top side.The top side of the substrate layer defines a substantially flatsurface. The first package further includes a die coupled to the bottomside of the substrate layer. The method further comprises providing asecond package having a plurality of rows of solder balls attached to abottom surface of the second package, and attaching, via the pluralityof rows of solder balls of the second package, the second package to thesubstantially flat surface of the first package.

BRIEF DESCRIPTION OF THE DRAWINGS

Embodiments of the present disclosure will be readily understood by thefollowing detailed description in conjunction with the accompanyingdrawings. To facilitate this description, like reference numeralsdesignate like structural elements. Embodiments herein are illustratedby way of example and not by way of limitation in the figures of theaccompanying drawings.

FIG. 1A schematically illustrates an example packaging arrangement thatincludes an example die arrangement of a die-down flipped PoP structure.

FIG. 1B schematically illustrates the example packaging arrangement ofFIG. 1A with a top package attached to a bottom package.

FIG. 2 schematically illustrates another example packaging arrangementthat includes another example die arrangement of a die-down flipped PoPstructure with exposed material to provide a path for thermaldissipation.

FIG. 3 schematically illustrates another example packaging arrangementthat includes another example die arrangement of a die-down flipped PoPstructure that is exposed, to provide a path for thermal dissipation.

FIG. 4 schematically illustrates another example packaging arrangementthat includes another example die arrangement of a die-down flipped PoPstructure with through-silicon vias (TSVs).

FIG. 5 schematically illustrates another example packaging arrangementthat includes another example die arrangement of a die-down flipped PoPstructure with an embedded printed circuit board (PCB) and/or aninterposer.

FIG. 6 schematically illustrates another example packaging arrangementthat includes another example die arrangement of a die-down flipped PoPstructure with a PCB/interposer.

FIG. 7 is a process flow diagram of a method for the PoP structuredescribed herein.

FIG. 8 schematically illustrates an example PoP packaging arrangement.

FIG. 9 schematically illustrates another example PoP packagingarrangement.

DETAILED DESCRIPTION

FIG. 1A illustrates a packaging arrangement 100 according to anembodiment where a package on package (PoP) packaging arrangementincludes a top package 102 and a bottom package 104. For illustrativepurposes, the packages are illustrated as separate items. The toppackage 102 includes a substrate layer 106. A die arrangement within thetop package 102 may include a first die 108 and a second die 110, inwhich each die 108, 110 is attached to the substrate layer 106 viasolder balls 112. This configuration may include underfill material 114in space between the solder balls 112 and the substrate layer 106. Thesolder balls 112 are generally located at bond pads or contact areas(not illustrated). The dies 108, 110 can be coupled to the substratelayer 106 via a flip-chip operation. Alternatively, a wire bondingprocess and an adhesive layer (not illustrated) may be used to couplethe dies 108, 110 to the substrate layer 106. Additionally, top package102 may comprise two or more individual top packages 102 (notillustrated), where each individual top package 102 includes one or moredies.

In accordance with various embodiments, the first die 108 and the seconddie 110 are memory devices and, in accordance with an embodiment, thefirst die 108 and the second die 110 are mobile double data rate (mDDR)synchronous dynamic random access memory (DRAM) for mobile devices.Mobile DDR is also known as low power DDR. However, other types ofmemory devices may be utilized, including but not limited to a doubledata rate synchronous dynamic random-access memory (DDR SDRAM), adynamic random access memory (DRAM), a NOR or a NAND Flash memory, astatic random-access memory (SRAM), and the like.

In accordance with another embodiment, the top package 102 with thefirst die 108 and the second die 110 is directed towardsapplication-specific products, and, in accordance with an embodiment,the first die 108 and/or the second die 110 may representapplication-specific integrated circuits (ASICs) for a mobile device.

The top package 102 further includes a plurality of solder balls 115.The plurality of solder balls 115 may be attached to a bottom side ofthe substrate layer 106 of the top package 102. In the embodiment ofFIG. 1A, the plurality of solder balls 115 forms a configuration forelectrically and physically attaching or stacking the top package 102 onthe bottom package 104.

For clarity, materials used within the top package 102 and othercomponents within the top package 102 may not be illustrated and/ordescribed in detail herein. Such materials and components are generallywell-known in the art.

The bottom package 104 includes a substrate layer 116 that includes atop side 117 a and a bottom side 117 b. As shown in FIG. 1A, the topside 117 a defines a substantially flat surface of the bottom package104, i.e. a substantially smooth surface that is substantially free ofgrooves, bumps, indentations, valleys, etc. In one embodiment, thesubstantially flat surface of the top side 117 a does not contain anycomponents, which permits the top side 117 a to receive (or support)various designs and selections of the top package 102. Thus, the flattop surface of the bottom package 104 provides a convenient way for theplurality of solder balls 115 of the top package 102 to attach to thebottom package 104, which allows for greater flexibility in designingtop package 102 (or multiple individual top packages 102) and thereby,designing packaging arrangement 100.

The bottom package 104 includes a die 118 attached to the bottom side117 b of the substrate layer 116 via an adhesive layer 120 in a die-downflipped structure. In other embodiments, as will be further discussedherein, the die 118 may be attached to the bottom side 117 b of thesubstrate layer 116 via solder balls.

In accordance with various embodiments, the die 118 may be a memorydevice, such as a mobile double data rate (mDDR) synchronous dynamicrandom access memory (DRAM) for mobile devices. Other types of memorydevices may be utilized, including but not limited to a double data ratesynchronous dynamic random-access memory (DDR SDRAM), a dynamic randomaccess memory (DRAM), a NOR or a NAND Flash memory, a staticrandom-access memory (SRAM), and the like. In accordance with anotherembodiment, the die 118 may be a logic device to create a mixedlogic-memory stacking that includes logic on the bottom package 104 andmemory on the top package 102.

The die 118 has surfaces that include one or more bond pads 122 a, 122b. The one or more bond pads 122 a, 122 b generally comprise anelectrically conductive material such as, for example, aluminum orcopper. Other suitable materials can be used in other embodiments. Thedie 118 is coupled to one or more substrate pads 124 a, 124 b located onthe substrate layer 116 via bonding wires 126 a, 126 b that are coupledto corresponding bond pads 122 a, 122 b. The die 118 may be affixed tothe bottom package 104 by molding material. In other embodiments, thedie 118 may electrically interconnect with the substrate layer 116 viaflip-chip or conductive adhesives. The electrical signals of the die 118can include, for example, input/output (I/O) signals and/or power/groundfor integrated circuit (IC) devices (not illustrated) formed on the die118.

In accordance with an embodiment, the bottom package 104 is created viaa Mold-Array-Process (MAP). The bottom package 104 further includes anenclosure 128, generally in the form of an encapsulant. The enclosure128 is etched to expose solder balls 129. Alternatively, the solderballs 129 are added into etched openings 131 of the enclosure 128 afteretching the enclosure 128. Solder balls 130 are added to solder balls129 and can be used to couple the packaging arrangement 100 to asubstrate (not illustrated) such as, for example, a printed circuitboard (PCB), another package, etc. Alternatively, single solder balls(combined solder balls 129 and solder balls 130) are added into theetched openings 131 after etching the enclosure 128. The solder balls130 are generally at the sides or around the periphery of the bottompackage 104, thereby forming a ball grid array (BGA).

For clarity, materials used within the bottom package 104 and othercomponents within the bottom package 104 may not be illustrated and/ordescribed in detail herein. Such materials and components are generallywell-known in the art.

FIG. 1B illustrates the packaging arrangement 100 with the top package102 attached to the bottom package 104. In the embodiment of FIGS. 1Aand 1B, the plurality of solder balls 115 forms a configuration forelectrically and physically attaching or stacking the top package 102 tothe bottom package 104. As previously noted, top package 102 maycomprise two or more individual top packages that are attached to thebottom package 104.

Additional embodiments of the present disclosure generally relate topackaging arrangements that include various embodiments of the bottompackage 104 with a die-down flipped structure and are illustrated inFIGS. 2-6. For brevity, the components illustrated in FIG. 1 that arethe same as or similar to the components in FIGS. 2-7 are not discussedfurther herein.

FIG. 2 illustrates another embodiment of a packaging arrangement 200that includes a top package 102 and a bottom package 204. In theembodiment of FIG. 2, a thermal conductive material 206 is included on abottom side of the die 118. In an embodiment, the thermal conductivematerial 206 is attached to the bottom side of the die 118 via anadhesive layer 208. The thermal conductive material 206 includes, but isnot limited to metal, silicon, or any material suitable for good thermalconductivity.

The bottom package 204 includes a thermal interface material (TIM) 210coupled to the thermal conductive material 206. The TIM 210 includes,but is not limited to, a film, a grease composition, and underfillmaterial. A film may be of an ultra-thin, thermally conductive material,which can be prepared by depositing an amorphous material. A greasecomposition may include a composition that has high thermal conductivityand excellent dispensation characteristics. A common TIM is awhite-colored paste or thermal grease, typically silicone oil filledwith aluminum oxide, zinc oxide, or boron nitride. Some types of TIMsuse micronized or pulverized silver. Another type of TIM includesphase-change materials. Phase-change materials generally are solid atroom temperature but liquefy and behave like grease at operatingtemperatures.

An underfill material may be chosen based on the desired physicalproperties. Thus, the thermal conductive material 206 provides a pathfor thermal dissipation to the TIM 210. The packaging arrangement 200can be coupled to a substrate (not illustrated) such as, for example, aPCB or another packaging arrangement. A hole may be provided in thesubstrate to accommodate the TIM 210.

FIG. 3 illustrates an embodiment of a packaging arrangement 300 thatincludes a top package 102 and a bottom package 304. The die 118 isattached to the substrate layer 116 via solder balls 306. In accordancewith various embodiments, underfill material 308 is provided between thedie 118 and the substrate layer 116 among the solder balls 306. Theunderfill material 308 provides protection of the joints formed by thesolder balls 306. It also prevents cracking and delamination of innerlayers of the die 118. The underfill material 308 may be a high purity,low stress liquid epoxy. Generally, the larger the size of the solderballs 306, the less need there is for the underfill material 308.

The bottom package 304 includes a thermal interface material (TIM) 310coupled to a backside of the die 118. The TIM 310 includes, but is notlimited to, a film, a grease composition, and underfill material, aspreviously described. In the embodiment of FIG. 3, the backside of thedie 118 is exposed. The exposed backside of the die 118 provides a pathfor thermal dissipation to the TIM 310. The packaging arrangement 300can be coupled to a substrate (not illustrated) such as, for example, aPCB or another packaging arrangement. A hole may be provided in thesubstrate to accommodate the TIM 310.

FIG. 4 illustrates an embodiment of a packaging arrangement 400 thatincludes a top package 102 and a bottom package 404. The die 118 isattached to the substrate layer 116 via solder bumps 306. Underfillmaterial 308 is provided in a space located between the die 118 and thesubstrate layer 116 of the bottom package 404. The underfill material308 provides protection of the joints formed by the solder balls 306.

In the embodiment of FIG. 4, the die 118 includes through-silicon vias(TSVs) 406. In an embodiment, the die 118 may be recessed within theenclosure 128 to help expose the backside of the die 118. The TSVs 406are vertical electrical connections vias (Vertical Interconnect Access)that pass through the die 118 to the solder balls 306. In an embodiment,the bottom package 404 includes additional solder balls 408 attached tothe bottom package 404. The additional solder balls 408 may be used for,for example, ground/power and input/outputs.

The one or more TSVs 406 are electrically coupled to bond pads (notillustrated) and are generally filled with an electrically conductivematerial, e.g., copper, to route electrical signals through the die 118.The TSVs 406 tend to provide improved performance with respect tobondwires as the density of the vias is substantially higher and thelength of the connections is shorter in comparison to bondwires. Theexposed backside of the die 118 provides for thermal dissipation of thebottom package 404. Thus, the packaging arrangement 400 can provideincreased pincount and higher speeds for electronic devices using thepackaging arrangement 400.

FIG. 5 illustrates an embodiment of a packaging arrangement 500 thatincludes a top package 102 and a bottom package 504. The die 118 isattached to the substrate layer 510 via solder bumps 306.

In the embodiment of FIG. 5, the bottom package 504 includes one or morePCBs and/or interposers 506 attached to the bottom side of the die 118.According to various embodiments, the PCB/interposer 506 is bonded tothe die 118 using a thermal compression process or a solder reflowprocess. That is, one or more electrically conductive structures (e.g.,pillars, bumps, pads, redistribution layer) are formed on thePCB/interposer 506 and the die 118 to form a bond between thePCB/interposer 506 and the die 118.

In some embodiments, the die 118 and the PCB/interposer 506 bothcomprise a material (e.g., silicon) having the same or similarcoefficient of thermal expansion (CTE). Using a material having the sameor similar CTE for the die 118 and the PCB/interposer 506 reduces stressassociated with heating and/or cooling mismatch of the materials.

The PCB/interposer 506 provides a physical buffer, support, andstrengthening agent to the die 118, particularly during the formation ofthe one or more layers to embed the die 118 in the enclosure 128. Thatis, the die 118 coupled to the PCB/interposer 506 as described hereinprovides a protected integrated circuit structure that is morestructurally resilient than the die 118 alone to stresses associatedwith fabricating the enclosure 128, resulting in improved yield andreliability of the bottom package 504.

In an embodiment, the bottom package 504 includes additional solderballs 512. The additional solder balls 512 attached to thePCB/interposer 506 may be used for, for example, ground/power andinput/outputs.

FIG. 6 illustrates an embodiment of a packaging arrangement 600 thatincludes a top package 102 and a bottom package 604. The die 118 isattached to the substrate layer 116 via the adhesive layer 120. Asillustrated, the die 118 is coupled to the substrate layer 116 via awire bonding process.

Solder bumps 606 are attached to the bottom side of the die 118. A PCBor an interposer 608 is attached to the solder balls 606. In anembodiment, the PCB/interposer 608 may be exposed or recessed. In anembodiment, the bottom package 604 includes additional solder balls 610.The additional solder balls 610 may be used for, for example,ground/power and input/outputs. The embodiment of FIG. 6 can allow foradditional pincount and provides a path via the PCB/interposer 608 forthermal dissipation of the bottom package 604.

FIG. 7 illustrates an example method 700, in accordance with anembodiment of the present disclosure. At 702, the method 700 includesproviding a first package including a substrate layer, wherein thesubstrate layer includes (i) a top side and (ii) a bottom side that isopposite to the top side, wherein the top side of the substrate layerdefines a substantially flat surface, and wherein the first packagefurther includes a die coupled to the bottom side of the substratelayer.

At 704, the method 700 includes providing a second package having aplurality of rows of solder balls attached to a bottom surface of thesecond package.

At 706, the method 700 includes attaching, via the plurality of rows ofsolder balls of the second package, the second package to thesubstantially flat surface of the first package.

The description may use perspective-based descriptions such as up/down,over/under, and/or, or top/bottom. Such descriptions are merely used tofacilitate the discussion and are not intended to restrict theapplication of embodiments described herein to any particularorientation.

For the purposes of the present disclosure, the phrase “A/B” means A orB. For the purposes of the present disclosure, the phrase “A and/or B”means “(A), (B), or (A and B).” For the purposes of the presentdisclosure, the phrase “at least one of A, B, and C” means “(A), (B),(C), (A and B), (A and C), (B and C), or (A, B and C).” For the purposesof the present disclosure, the phrase “(A)B” means “(B) or (AB)” thatis, A is an optional element.

Various operations are described as multiple discrete operations inturn, in a manner that is most helpful in understanding the claimedsubject matter. However, the order of description should not beconstrued as to imply that these operations are necessarilyorder-dependent. In particular, these operations may not be performed inthe order of presentation. Operations described may be performed in adifferent order than the described embodiment. Various additionaloperations may be performed and/or described operations may be omittedin additional embodiments.

The description uses the phrases “in an embodiment,” “in embodiments,”or similar language, which may each refer to one or more of the same ordifferent embodiments. Furthermore, the terms “comprising,” “including,”“having,” and the like, as used with respect to embodiments of thepresent disclosure, are synonymous.

The terms chip, integrated circuit, monolithic device, semiconductordevice, die, and microelectronic device are often used interchangeablyin the microelectronics field. The present invention is applicable toall of the above as they are generally understood in the field.

Although certain embodiments have been illustrated and described herein,a wide variety of alternate and/or equivalent embodiments orimplementations calculated to achieve the same purposes may besubstituted for the embodiments illustrated and described withoutdeparting from the scope of the present disclosure. This disclosure isintended to cover any adaptations or variations of the embodimentsdiscussed herein. Therefore, it is manifestly intended that embodimentsdescribed herein be limited only by the claims and the equivalentsthereof.

What is claimed is:
 1. A package on package arrangement comprising: afirst package including a substrate layer including (i) a top side, and(ii) a bottom side that is opposite to the top side, wherein the topside of the substrate layer defines a substantially flat surface; a diecoupled to the bottom side of the substrate layer; an encapsulantcovering the die; a ball grid array (BGA) of first solder balls inrecesses of the encapsulant; and second solder balls melted by anon-weld process to the first solder balls in the recesses of theencapsulant, wherein the second solder balls (i) are partially in therecesses of the encapsulant and (ii) partially protrude beyond theencapsulant, wherein the portion of the second solder balls thatprotrudes beyond the encapsulant is substantially spherical, smooth, andvoid of any sharp features; and a second package including a pluralityof rows of third solder balls that extend (i) across the substantiallyflat surface of the top side of the substrate layer of the first packageand (ii) over the die coupled to the bottom side of the substrate layerof the first package, wherein the second package is attached, via theplurality of rows of third solder balls, to the substantially flatsurface of the top side of the substrate layer of the first package. 2.The package on package arrangement of claim 1, further comprising: anadhesive layer located between the die and the substrate layer, whereinthe adhesive layer attaches the die to the bottom side of the substratelayer of the first package.
 3. The package on package arrangement ofclaim 1, further comprising: a bond pad located on the bottom side ofthe die; and a substrate pad located on the bottom side of the substratelayer of the first package, wherein the bond pad of the die is coupled,via a wire, to the substrate pad of the substrate layer to routeelectrical signals of the die.
 4. The package on package arrangement ofclaim 1, wherein: the substrate layer comprises a first substrate layer;the second package comprises a first die arranged next to a second die;and each of the first die and the second die is connected to a secondsubstrate layer in the second package via fourth solder balls.
 5. Thepackage on package arrangement of claim 4, wherein at least some of theplurality of rows of third solder balls are between (i) the first dieand the second die of the second package and (ii) the die coupled to thebottom side of the substrate layer.
 6. The package on packagearrangement of claim 1, further comprising: thermal interface materialattached to a bottom side of the die.
 7. The package on packagearrangement of claim 6, further comprising: thermal conductive materialattached to the thermal interface material.
 8. The package on packagearrangement of claim 7, wherein the thermal interface material comprisesone of a film, a grease composition, or an underfill material.
 9. Thepackage on package arrangement of claim 1, further comprising: fourthsolder balls attached to the bottom side of the substrate layer and atop side of the die; and a plurality of through-silicon vias located inthe die, wherein the plurality of through-silicon vias respectivelyextend between (i) at least some of the fourth solder balls and (ii) aplurality of fifth solder balls that are attached to a bottom side ofthe bottom package.
 10. A stackable semiconductor package comprising: afirst package including a substrate layer including (i) a top side, and(ii) a bottom side that is opposite to the top side, wherein the topside of the substrate layer defines a substantially flat surface; a diecoupled to the bottom side of the substrate layer; an encapsulantcovering the die; a ball grid array (BGA) of first solder balls inrecesses of the encapsulant; second solder balls melted to the firstsolder balls in the recesses of the encapsulant, wherein the secondsolder balls (i) are partially in the recesses of the encapsulant and(ii) partially protrude beyond the encapsulant by a first distance; andthird solder balls (i) electrically connected to the die via aninterposer and (ii) protruding beyond the encapsulant by a seconddistance equal to the first distance; and a second package including aplurality of rows of fourth solder balls that extend (i) across thesubstantially flat surface of the top side of the substrate layer of thefirst package and (ii) over the die coupled to the bottom side of thesubstrate layer of the first package, wherein the second package isattached, via the plurality of rows of fourth solder balls, to thesubstantially flat surface of the top side of the substrate layer of thefirst package.
 11. The package on package arrangement of claim 10,further comprising: an adhesive layer located between the die and thesubstrate layer, wherein the adhesive layer attaches the die to thebottom side of the substrate layer of the first package.
 12. The packageon package arrangement of claim 10, further comprising: a bond padlocated on the bottom side of the die; and a substrate pad located onthe bottom side of the substrate layer of the first package, wherein thebond pad of the die is coupled, via a wire, to the substrate pad of thesubstrate layer to route electrical signals of the die.
 13. The packageon package arrangement of claim 10, wherein: the substrate layercomprises a first substrate layer; the second package comprises a firstdie arranged next to a second die; and each of the first die and thesecond die is connected to a second substrate layer in the secondpackage via fifth solder balls.
 14. The package on package arrangementof claim 10, further comprising: thermal interface material attached toa bottom side of the die.
 15. The package on package arrangement ofclaim 14, further comprising: thermal conductive material attached tothe thermal interface material.
 16. The package on package arrangementof claim 15, wherein the thermal interface material comprises one of afilm, a grease composition, or an underfill material.
 17. The package onpackage arrangement of claim 10, further comprising: a printed circuitboard attached to a bottom side of the die.
 18. The package on packagearrangement of claim 10, further comprising: third solder balls attachedto the bottom side of the substrate layer and a top side of the die; anda plurality of through-silicon vias located in the die, wherein theplurality of through-silicon vias respectively extend between at leastsome of the third solder balls, and a plurality of fourth solder ballsthat are attached to a bottom side of the bottom package.
 19. Thepackage on package arrangement of claim 10, further comprising: fifthsolder balls attached to the bottom side of the substrate layer and atop side of the die.